6

Mechanism of dislocation formation during vertical solid phase epitaxy

Année:
1990
Langue:
english
Fichier:
PDF, 358 KB
english, 1990
36

Novel Fabrication Process for HfO 2 Thin Film for Gate Dielectric

Année:
2005
Langue:
english
Fichier:
PDF, 161 KB
english, 2005
47

Generation and Controlling the Trap in Absorbent Germanium Oxide Film

Année:
2011
Langue:
english
Fichier:
PDF, 588 KB
english, 2011
50

Characteristic Change of GeO 2 /Ge Interface by Hf-Post Metallization Annealing

Année:
2018
Langue:
english
Fichier:
PDF, 482 KB
english, 2018